A 3D-Integrated 2-Megapixel Imager with Sparse Capture and Fine-Grain Power Gating

: Berkovich, A.; Alkalay, S.; Tsai, T.; Liu, C.; Laiho, M.; Paasio, A.; Poikonen, J.; Grönroos, M.; Kutila, M.; Mäki, P.; Naula, M.; Säntti, T.; Komulainen, T.

: N/A

: International Electron Devices Meeting

Publisher: IEEE

: 2023

 Technical digest - International Electron Devices Meeting

: 2023 International Electron Devices Meeting (IEDM)

: 1

: 4

: 979-8-3503-2768-7

: 979-8-3503-2767-0

: 0163-1918

: 2156-017X

DOI: https://doi.org/10.1109/IEDM45741.2023.10413713

: https://doi.org/10.1109/iedm45741.2023.10413713