A4 Refereed article in a conference publication

A 3D-Integrated 2-Megapixel Imager with Sparse Capture and Fine-Grain Power Gating

Authors: Berkovich, A.; Alkalay, S.; Tsai, T.; Liu, C.; Laiho, M.; Paasio, A.; Poikonen, J.; Grönroos, M.; Kutila, M.; Mäki, P.; Naula, M.; Säntti, T.; Komulainen, T.

Editors: N/A

Conference name: International Electron Devices Meeting

Publisher: IEEE

Publication year: 2023

Journal: Technical digest - International Electron Devices Meeting

Book title : 2023 International Electron Devices Meeting (IEDM)

First page : 1

Last page: 4

ISBN: 979-8-3503-2768-7

eISBN: 979-8-3503-2767-0

ISSN: 0163-1918

eISSN: 2156-017X

DOI: https://doi.org/10.1109/IEDM45741.2023.10413713

Publication's open availability at the time of reporting: No Open Access

Publication channel's open availability : No Open Access publication channel

Web address : https://doi.org/10.1109/iedm45741.2023.10413713