Image Quality Assessment by Integration of Low-level & High-Level Features: Threshold Similarity Index

: Chaudhary Jatin, Pant Dibakar Raj, Pokharel Suresh, Skön Jukka-Pekka, Heikkonen Jukka, Kanth Rajeev

: N/A

: IEEE International Symposium on Industrial Electronics

: 2022

: Proceedings of the IEEE International Symposium on Industrial Electronics

: 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)

: Proceedings of the IEEE International Symposium on Industrial Electronics

: 135

: 141

: 978-1-6654-8241-7

: 978-1-6654-8240-0

: 2163-5137

DOI: https://doi.org/10.1109/ISIE51582.2022.9831651

: https://ieeexplore.ieee.org/document/9831651