A4 Refereed article in a conference publication
Image Quality Assessment by Integration of Low-level & High-Level Features: Threshold Similarity Index
Authors: Chaudhary Jatin, Pant Dibakar Raj, Pokharel Suresh, Skön Jukka-Pekka, Heikkonen Jukka, Kanth Rajeev
Editors: N/A
Conference name: IEEE International Symposium on Industrial Electronics
Publication year: 2022
Journal: Proceedings of the IEEE International Symposium on Industrial Electronics
Book title : 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)
Series title: Proceedings of the IEEE International Symposium on Industrial Electronics
First page : 135
Last page: 141
ISBN: 978-1-6654-8241-7
eISBN: 978-1-6654-8240-0
ISSN: 2163-5137
DOI: https://doi.org/10.1109/ISIE51582.2022.9831651
Web address : https://ieeexplore.ieee.org/document/9831651