A4 Refereed article in a conference publication

Image Quality Assessment by Integration of Low-level & High-Level Features: Threshold Similarity Index

Authors: Chaudhary Jatin, Pant Dibakar Raj, Pokharel Suresh, Skön Jukka-Pekka, Heikkonen Jukka, Kanth Rajeev

Editors: N/A

Conference name: IEEE International Symposium on Industrial Electronics

Publication year: 2022

Journal: Proceedings of the IEEE International Symposium on Industrial Electronics

Book title : 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)

Series title: Proceedings of the IEEE International Symposium on Industrial Electronics

First page : 135

Last page: 141

ISBN: 978-1-6654-8241-7

eISBN: 978-1-6654-8240-0

ISSN: 2163-5137

DOI: https://doi.org/10.1109/ISIE51582.2022.9831651

Web address : https://ieeexplore.ieee.org/document/9831651