A4 Refereed article in a conference publication

Image Quality Assessment by Integration of Low-level & High-Level Features: Threshold Similarity Index




AuthorsChaudhary Jatin, Pant Dibakar Raj, Pokharel Suresh, Skön Jukka-Pekka, Heikkonen Jukka, Kanth Rajeev

EditorsN/A

Conference nameIEEE International Symposium on Industrial Electronics

Publication year2022

JournalProceedings of the IEEE International Symposium on Industrial Electronics

Book title 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)

Series titleProceedings of the IEEE International Symposium on Industrial Electronics

First page 135

Last page141

ISBN978-1-6654-8241-7

eISBN978-1-6654-8240-0

ISSN2163-5137

DOIhttps://doi.org/10.1109/ISIE51582.2022.9831651

Web address https://ieeexplore.ieee.org/document/9831651




Last updated on 2024-26-11 at 19:58