A1 Refereed original research article in a scientific journal
Recombination Rate of D Atoms in Solid D2 in the Temperature Range from 0.23 to 1.64 K
Authors: Wetzel, C. K.; Lee, D. M.; Sheludiakov, S.; Ahokas, J.; Vasiliev, S.; Khmelenko, V. V.
Publisher: Springer Nature
Publication year: 2026
Journal: Journal of Low Temperature Physics
Article number: 40
Volume: 222
Issue: 2
ISSN: 0022-2291
eISSN: 1573-7357
DOI: https://doi.org/10.100a7/s10909-026-03375-x
Publication's open availability at the time of reporting: Open Access
Publication channel's open availability : Partially Open Access publication channel
Web address : https://doi.org/10.100a7/s10909-026-03375-x
Self-archived copy’s web address: https://research.utu.fi/converis/portal/detail/Publication/516121102
Self-archived copy's licence: CC BY
Self-archived copy's version: Publisher`s PDF
The recombination rates of D atoms in solid D2 films were measured in the temperature range 0.23–1.64 K. Atoms were formed in thin D2 films by maintaining radio-frequency discharge above the film surface for several days. After stopping discharge the decay of D atoms concentrations was monitored at different temperatures by the method of electron spin resonance (ESR). Decreasing the films temperature from 1.64 to 0.23 K resulted in reducing the recombination rate from 7.2 × 10−26 cm3s−1 to 1.0 × 10−27 cm3s−1.
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Funding information in the publication:
D.M.L. and V.V.K. provided financial support.
