O2 Muu julkaisu
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
Tekijät: Niozu A., Kumagai Y., Nishiyama T., Fukuzawa H., Motomura K., Bucher M., Ito Y., Takanashi T., Asa K., Sato Y., You D., Li Y., Ono T., Kukk E., Miron C., Neagu L., Callegari C., Fraia M.D., Rossi G., Galli D.E., Pincelli T., Colombo A., Kameshima T., Joti Y., Hatsui T., Owada S., Katayama T., Togashi T., Tono K., Yabashi M., Matsuda K., Bostedt C., Nagaya K., Ueda K., Ueda K., Nagaya K.
Konferenssin vakiintunut nimi: International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC)
Julkaisuvuosi: 2020
Journal: Journal of Physics: Conference Series
Tietokannassa oleva lehden nimi: Journal of Physics: Conference Series
Numero sarjassa: Number 20, June 2020
Vuosikerta: 1412
Aloitussivu: 202028
Sivujen määrä: 1
ISSN: 1742-6588
DOI: https://doi.org/10.1088/1742-6596/1412/20/202028
Rinnakkaistallenteen osoite: https://research.utu.fi/converis/portal/detail/Publication/49084494
We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.
Ladattava julkaisu This is an electronic reprint of the original article. |  |
