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Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
Authors: Niozu A., Kumagai Y., Nishiyama T., Fukuzawa H., Motomura K., Bucher M., Ito Y., Takanashi T., Asa K., Sato Y., You D., Li Y., Ono T., Kukk E., Miron C., Neagu L., Callegari C., Fraia M.D., Rossi G., Galli D.E., Pincelli T., Colombo A., Kameshima T., Joti Y., Hatsui T., Owada S., Katayama T., Togashi T., Tono K., Yabashi M., Matsuda K., Bostedt C., Nagaya K., Ueda K., Ueda K., Nagaya K.
Conference name: International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC)
Publication year: 2020
Journal: Journal of Physics: Conference Series
Journal name in source: Journal of Physics: Conference Series
Number in series: Number 20, June 2020
Volume: 1412
First page : 202028
Number of pages: 1
ISSN: 1742-6588
DOI: https://doi.org/10.1088/1742-6596/1412/20/202028(external)
Self-archived copy’s web address: https://research.utu.fi/converis/portal/detail/Publication/49084494(external)
We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.
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