Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

: Niozu A., Kumagai Y., Nishiyama T., Fukuzawa H., Motomura K., Bucher M., Ito Y., Takanashi T., Asa K., Sato Y., You D., Li Y., Ono T., Kukk E., Miron C., Neagu L., Callegari C., Fraia M.D., Rossi G., Galli D.E., Pincelli T., Colombo A., Kameshima T., Joti Y., Hatsui T., Owada S., Katayama T., Togashi T., Tono K., Yabashi M., Matsuda K., Bostedt C., Nagaya K., Ueda K., Ueda K., Nagaya K.

: International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC)

: 2020

: Journal of Physics: Conference Series

: Number 20, June 2020

: 1412

: 202028

: 1

: 1742-6588

DOI: https://doi.org/10.1088/1742-6596/1412/20/202028

: https://research.utu.fi/converis/portal/detail/Publication/49084494

We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

Niozu_2020_J._Phys. _Conf._Ser._1412_202028.pdf