Thermal-Cycling-aware Dynamic Reliability Management in Many-Core System-on-Chip

: Haghbayan M.H., Miele A., Zouv Z., Tenhunen H., Plosila J.

: Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu

: Design, Automation & Test in Europe Conference & Exhibition

Publisher: Institute of Electrical and Electronics Engineers Inc.

: 2020

: Proceedings : Design, Automation, and Test in Europe Conference and Exhibition

: 2020 Design, Automation & Test in Europe Conference and Exhibition (DATE)

: Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020

: 1229

: 1234

: 978-1-7281-4468-9

: 978-3-9819263-4-7

: 1530-1591