Observation of strained SiGe nanoislands embedded in a Si matrix using ambient crosssectional atomic force microscopy

: Titkov A., Dunaevskii M., Krasilnik Z., Lobanov D., Novikov A., Laiho R.

: A. G. Cullis, P. A. Midgley

: Microscopy of Semiconducting Materials

Publisher: CRC Press

: Boca Raton, FL

: 2018

Springer Proceedings in Physics

: Microscopy of Semiconducting Materials 2003: Proceedings of the Institute of Physics Conference, Cambridge University, 31 March- 3 April 2003

Microscopy of Semiconducting Materials 2003

: 123

: 978-1-351-07463-6

: 0930-8989