A4 Refereed article in a conference publication

Observation of strained SiGe nanoislands embedded in a Si matrix using ambient crosssectional atomic force microscopy

Authors: Titkov A., Dunaevskii M., Krasilnik Z., Lobanov D., Novikov A., Laiho R.

Editors: A. G. Cullis, P. A. Midgley

Conference name: Microscopy of Semiconducting Materials

Publisher: CRC Press

Publishing place: Boca Raton, FL

Publication year: 2018

Journal: Springer Proceedings in Physics

Book title : Microscopy of Semiconducting Materials 2003: Proceedings of the Institute of Physics Conference, Cambridge University, 31 March- 3 April 2003

Journal name in source: Microscopy of Semiconducting Materials 2003

First page : 123

eISBN: 978-1-351-07463-6

ISSN: 0930-8989

DOI: https://doi.org/10.1201/9781351074636