A4 Vertaisarvioitu artikkeli konferenssijulkaisussa
Surface topography and electrical properties in Sr2FeMoO6 films studied at cryogenic temperatures
Tekijät: I. Angervo, M. Saloaro, J. Mäkelä, J.-P. Lehtiö, H. Huhtinen, P. Paturi
Toimittaja: Jonas Bylander, Tomas Löfwander, Maciej Misiorny
Konferenssin vakiintunut nimi: International Conference on Low Temperature Physics
Kustantaja: Institute of Physics Publishing
Julkaisuvuosi: 2018
Journal: Journal of Physics: Conference Series
Kokoomateoksen nimi: 28th International Conference on Low Temperature Physics (LT28) 9–16 August 2017, Gothenburg, Sweden
Tietokannassa oleva lehden nimi: Journal of Physics: Conference Series
Numero sarjassa: 1
Vuosikerta: 969
Sivujen määrä: 6
ISSN: 1742-6588
DOI: https://doi.org/10.1088/1742-6596/969/1/012107
Rinnakkaistallenteen osoite: https://research.utu.fi/converis/portal/detail/Publication/32080270
Pulsed laser deposited Sr2FeMoO6 thin films were
investigated for the first time with scanning tunneling microscopy and
spectroscopy. The results confirm atomic scale layer growth, with
step-terrace structure corresponding to a single lattice cell scale. The
spectroscopy research reveals a distribution of local electrical
properties linked to structural deformation in the initial thin film
layers at the film substrate interface. Significant hole structure
giving rise to electrically distinctive regions in thinner film also
seems to set a thickness limit for the thinnest films to be used in
applications.
Ladattava julkaisu This is an electronic reprint of the original article. |  |
