A4 Refereed article in a conference publication
Surface topography and electrical properties in Sr2FeMoO6 films studied at cryogenic temperatures
Authors: I. Angervo, M. Saloaro, J. Mäkelä, J.-P. Lehtiö, H. Huhtinen, P. Paturi
Editors: Jonas Bylander, Tomas Löfwander, Maciej Misiorny
Conference name: International Conference on Low Temperature Physics
Publisher: Institute of Physics Publishing
Publication year: 2018
Journal: Journal of Physics: Conference Series
Book title : 28th International Conference on Low Temperature Physics (LT28) 9–16 August 2017, Gothenburg, Sweden
Journal name in source: Journal of Physics: Conference Series
Number in series: 1
Volume: 969
Number of pages: 6
ISSN: 1742-6588
DOI: https://doi.org/10.1088/1742-6596/969/1/012107
Self-archived copy’s web address: https://research.utu.fi/converis/portal/detail/Publication/32080270
Pulsed laser deposited Sr2FeMoO6 thin films were
investigated for the first time with scanning tunneling microscopy and
spectroscopy. The results confirm atomic scale layer growth, with
step-terrace structure corresponding to a single lattice cell scale. The
spectroscopy research reveals a distribution of local electrical
properties linked to structural deformation in the initial thin film
layers at the film substrate interface. Significant hole structure
giving rise to electrically distinctive regions in thinner film also
seems to set a thickness limit for the thinnest films to be used in
applications.
Downloadable publication This is an electronic reprint of the original article. |  |
