Online Testing of Many-Core Systems in the Dark Silicon Era




Mohammad-Hashem Haghbayan, Amir-Mohammad Rahmani, Pasi Liljeberg, Juha Plosila, Hannu Tenhunen

Witold Pleskacz

IEEE symposium on design and diagnostics of electronic circuits and systems

2014

2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2014)

141

146

6

978-1-4799-4558-0

978-1-4799-4559-7

2334-3133

http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6868778




Last updated on 2024-26-11 at 20:52