A4 Refereed article in a conference publication

Online Testing of Many-Core Systems in the Dark Silicon Era

Authors: Mohammad-Hashem Haghbayan, Amir-Mohammad Rahmani, Pasi Liljeberg, Juha Plosila, Hannu Tenhunen

Editors: Witold Pleskacz

Conference name: IEEE symposium on design and diagnostics of electronic circuits and systems

Publication year: 2014

Book title : 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2014)

First page : 141

Last page: 146

Number of pages: 6

ISBN: 978-1-4799-4558-0

eISBN: 978-1-4799-4559-7

ISSN: 2334-3133

Web address : http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6868778