A2 Vertaisarvioitu katsausartikkeli tieteellisessä lehdessä
Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements
Tekijät: Kukk E, Motomura K, Fukuzawa H, Nagaya K, Ueda K
Kustantaja: MDPI AG
Kustannuspaikka: Basel
Julkaisuvuosi: 2017
Journal: Applied Sciences
Tietokannassa oleva lehden nimi: APPLIED SCIENCES-BASEL
Lehden akronyymi: APPL SCI-BASEL
Artikkelin numero: ARTN 531
Vuosikerta: 7
Numero: 5
Sivujen määrä: 14
ISSN: 2076-3417
DOI: https://doi.org/10.3390/app7050531
Verkko-osoite: http://www.mdpi.com/2076-3417/7/5/531
Rinnakkaistallenteen osoite: https://research.utu.fi/converis/portal/detail/Publication/25772070
X-ray free electron lasers (XFELs) providing ultrashort intense pulses of X-rays have proven to be excellent tools to investigate the dynamics of radiation-induced dissociation and charge redistribution in molecules and nanoparticles. Coincidence techniques, in particular multi-ion time-of-flight (TOF) coincident experiments, can provide detailed information on the photoabsorption, charge generation, and Coulomb explosion events. Here we review several such recent experiments performed at the SPring-8 Angstrom Compact free electron LAser (SACLA) facility in Japan, with iodomethane, diiodomethane, and 5-iodouracil as targets. We demonstrate how to utilize the momentum-resolving capabilities of the ion TOF spectrometers to resolve and filter the coincidence data and extract various information essential in understanding the time evolution of the processes induced by the XFEL pulses.
Ladattava julkaisu This is an electronic reprint of the original article. |  |
