A2 Refereed review article in a scientific journal
Molecular Dynamics of XFEL-Induced Photo-Dissociation, Revealed by Ion-Ion Coincidence Measurements
Authors: Kukk E, Motomura K, Fukuzawa H, Nagaya K, Ueda K
Publisher: MDPI AG
Publishing place: Basel
Publication year: 2017
Journal: Applied Sciences
Journal name in source: APPLIED SCIENCES-BASEL
Journal acronym: APPL SCI-BASEL
Article number: ARTN 531
Volume: 7
Issue: 5
Number of pages: 14
ISSN: 2076-3417
DOI: https://doi.org/10.3390/app7050531
Web address : http://www.mdpi.com/2076-3417/7/5/531
Self-archived copy’s web address: https://research.utu.fi/converis/portal/detail/Publication/25772070
X-ray free electron lasers (XFELs) providing ultrashort intense pulses of X-rays have proven to be excellent tools to investigate the dynamics of radiation-induced dissociation and charge redistribution in molecules and nanoparticles. Coincidence techniques, in particular multi-ion time-of-flight (TOF) coincident experiments, can provide detailed information on the photoabsorption, charge generation, and Coulomb explosion events. Here we review several such recent experiments performed at the SPring-8 Angstrom Compact free electron LAser (SACLA) facility in Japan, with iodomethane, diiodomethane, and 5-iodouracil as targets. We demonstrate how to utilize the momentum-resolving capabilities of the ion TOF spectrometers to resolve and filter the coincidence data and extract various information essential in understanding the time evolution of the processes induced by the XFEL pulses.
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