Energy-Efficient Concurrent Testing Approach for Many-Core Systems in the Dark Silicon Age

: Mohammad-Hashem Haghbayan, Amir-Mohammad Rahmani, Pasi Liljeberg, Juha Plosila, Hannu Tenhunen

: Said Hamdioui, Marco Ottavi

: IEEE international symposium on defect and fault tolerance in vlsi systems (DFT)

: 2014

: Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on

: 978-1-4799-6156-6