A4 Refereed article in a conference publication

Energy-Efficient Concurrent Testing Approach for Many-Core Systems in the Dark Silicon Age

Authors: Mohammad-Hashem Haghbayan, Amir-Mohammad Rahmani, Pasi Liljeberg, Juha Plosila, Hannu Tenhunen

Editors: Said Hamdioui, Marco Ottavi

Conference name: IEEE international symposium on defect and fault tolerance in vlsi systems (DFT)

Publication year: 2014

Book title : Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on

ISBN: 978-1-4799-6156-6