CoBRA: Low cost compensation of TSV failures in 3D-NoC

: Ronak Salamat, Masoumeh Ebrahimi, Nader Bagherzadeh, Freek Verbeek

: General Co-Chairs: Omer Khan, Maria K. Michael

: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

: 2016

: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

: 115

: 120

: 6

: 978-1-5090-3624-0

: 978-1-5090-3623-3

DOI: https://doi.org/10.1109/DFT.2016.7684081