A4 Refereed article in a conference publication

CoBRA: Low cost compensation of TSV failures in 3D-NoC

Authors: Ronak Salamat, Masoumeh Ebrahimi, Nader Bagherzadeh, Freek Verbeek

Editors: General Co-Chairs: Omer Khan, Maria K. Michael

Conference name: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Publication year: 2016

Book title : 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

First page : 115

Last page: 120

Number of pages: 6

ISBN: 978-1-5090-3624-0

eISBN: 978-1-5090-3623-3

DOI: https://doi.org/10.1109/DFT.2016.7684081