Thread-level Parallelism in Fault Simulation of Deep Neural Networks on Multi-Processor Systems

: Karami Masoomeh, Haghbayan Mohammad-Hashem, Ebrahimi Masoumeh, Miele Antonio, Plosila Juha

: Luca Cassano, Sreejit Chakravarty, Alberto Bosio

: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

: 2022

: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

: 978-1-6654-5939-6

: 978-1-6654-5938-9

: 2576-1501

: 2765-933X

DOI: https://doi.org/10.1109/DFT56152.2022.9962358

: https://ieeexplore.ieee.org/document/9962358