A4 Refereed article in a conference publication

Thread-level Parallelism in Fault Simulation of Deep Neural Networks on Multi-Processor Systems

Authors: Karami Masoomeh, Haghbayan Mohammad-Hashem, Ebrahimi Masoumeh, Miele Antonio, Plosila Juha

Editors: Luca Cassano, Sreejit Chakravarty, Alberto Bosio

Conference name: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Publication year: 2022

Book title : 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Series title: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

ISBN: 978-1-6654-5939-6

eISBN: 978-1-6654-5938-9

ISSN: 2576-1501

eISSN: 2765-933X

DOI: https://doi.org/10.1109/DFT56152.2022.9962358

Web address : https://ieeexplore.ieee.org/document/9962358