A1 Refereed original research article in a scientific journal
Proton irradiation effects on metal-YBCO interfaces
Authors: Levy P., Golmar F., Acha C., Sanca G.A., Barella M., Alurralde M., Marlasca F.G., Huhtinen H., Paturi P.
Publisher: Elsevier Ltd
Publication year: 2021
Journal: Radiation Physics and Chemistry
Journal name in source: Radiation Physics and Chemistry
Article number: 109404
Volume: 183
eISSN: 0969-806X
DOI: https://doi.org/10.1016/j.radphyschem.2021.109404(external)
Self-archived copy’s web address: https://research.utu.fi/converis/portal/detail/Publication/53908024(external)
10 MeV proton-irradiation effects on a YBCO-based test structure were analyzed by measuring its current-voltage (IV) characteristics for different cumulated fluences. For fluences of up to ~ 80⋅109 p/cm2 no changes in the electrical behavior of the device were observed, while for a fluence of ~ 300⋅109 p/cm2 it becomes less conducting. A detailed analysis of the room temperature IV characteristics based on the γ power exponent parameter [γ = dLn(I)/dLn(V)] allowed us to reveal the main conduction mechanisms as well as to establish the equivalent circuit model of the device. The changes produced in the electrical behavior, in accordance with Monte Carlo TRIM simulations, suggest that the main effect induced by protons is the displacement of oxygen atoms within the YBCO lattice, particularly from oxygen-rich to oxygen-poor areas, where they become trapped.
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