Hyperspectral Texture Metrology Based on Joint Probability of Spectral and Spatial Distribution

: Chu Rui Jian; Richard Noel; Chatoux Hermine; Fernandez-Maloigne Christine; Hardeberg Jon Yngve

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

: 2021

IEEE Transactions on Image Processing

: 30

: 4341

: 4356

: 1057-7149

: 1941-0042