Hyperspectral Texture Metrology Based on Distance Measures in an Information-Theoretic Framework

: Chu Rui Jian; Chen Jie; Rahardja Susanto

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

: 2025

 IEEE Transactions on Image Processing

: 34

: 6331

: 6346

: 1057-7149

: 1941-0042

DOI: https://doi.org/10.1109/tip.2025.3608667

: https://doi.org/10.1109/tip.2025.3608667