Surface Properties of p‐GaN and Formation of Nickel Metal Contacts




Miettinen, Mikko; Nuutila, Vesa; Jahanshah Rad, Zahra; Ebrahimzadeh, Masoud; Ruokonen, Anni; Punkkinen, Risto; Lehtio, Juha-Pekka; Punkkinen, Marko; Laukkanen, Pekka; Kokko, Kalevi; Suihkonen, Sami; Savin, Hele; Wang, Weimin

PublisherWiley

HOBOKEN

2025

Advanced Materials Interfaces

Advanced Materials Interfaces

ADV MATER INTERFACES

2500163

12

13

9

2196-7350

2196-7350

DOIhttps://doi.org/10.1002/admi.202500163

https://doi.org/10.1002/admi.202500163

https://research.utu.fi/converis/portal/detail/Publication/499521532



Nickel (Ni) is the key component in ohmic contacts for Mg-doped p-GaN, but the detailed formation mechanisms of the ohmic contact have not yet been understood. In this work, the effect of potassium hydroxide (KOH)-based chemical treatment on the surface of p-GaN is investigated using X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy (STM), and low-energy electron diffraction (LEED). Ni metal contacts on the chemically treated p-GaN surface are studied using transfer length method (TLM) and synchrotron radiation photoelectron spectroscopy (SR-XPS). The chemical treatment of p-GaN improves the brightness of the (1x1) hexagonal diffraction pattern in LEED and keeps the 2D terrace structure in STM visible. Concomitantly, XPS shows that the amount of O, C, and Mg-O bonds at the surface were reduced. Ni/p-GaN provided an ohmic contact after annealing in ultra-high vacuum (UHV) at 500 degrees C. Simultaneously, SR-XPS shows the diffusion of Ga to Ni and the formation of a previously unreported Ga 3d component, which has a surprisingly narrow line shape, indicating that it originates from a crystalline interface phase. Diffusion of Ga is discussed to cause Ga vacancies and acceptor levels in the bandgap increasing carrier tunneling, thus enabling ohmic contact.


The authors thank the MAX IV and its staff for the possibility to conduct experiments at the FinEstBeams beam line. Financial support from Research Council of Finland and University of Turku Graduate School is acknowledged.


Last updated on 2025-27-08 at 13:34