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X-Ray Polarimetry as a Tool to Constrain Orbital Parameters in X-Ray Binaries




TekijätRankin John, Kravtsov Vadim, Muleri Fabio, Poutanen Juri, Marin Frédéric, Capitanio Fiamma, Matt Giorgio, Costa Enrico, Marco Alessandro Di, Fabiani Sergio, La Monaca Fabio, Marra Lorenzo, Soffitta Paolo

KustantajaThe American Astronomical Society

Julkaisuvuosi2024

JournalAstrophysical Journal

Tietokannassa oleva lehden nimiThe Astrophysical Journal

Artikkelin numero34

Vuosikerta962

Numero1

eISSN1538-4357

DOIhttps://doi.org/10.3847/1538-4357/ad1991

Verkko-osoitehttps://iopscience.iop.org/article/10.3847/1538-4357/ad1991

Rinnakkaistallenteen osoitehttps://research.utu.fi/converis/portal/detail/Publication/386840119

Preprintin osoitehttps://arxiv.org/abs/2312.16967


Tiivistelmä
X-ray binary systems consist of a companion star and a compact object in close orbit. Thanks to their copious X-ray emission, these objects have been studied in detail using X-ray spectroscopy and timing. The inclination of these systems is a major uncertainty in the determination of the mass of the compact object using optical spectroscopic methods. In this paper, we present a new method to constrain the inclination of X-ray binaries, which is based on the modeling of the polarization of X-rays photons produced by a compact source and scattered off the companion star. We describe our method and explore the potential of this technique in the specific case of the low-mass X-ray binary GS 1826−238 observed by the Imaging X-ray Polarimetry Explorer observatory.

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