A1 Vertaisarvioitu alkuperäisartikkeli tieteellisessä lehdessä
A long-arm autocorrelator for measurement of pico- to nanosecond laser pulse widths
Tekijät: Stenholm T., Soini J., Hänninen P.
Julkaisuvuosi: 2004
Lehti:: Measurement Science and Technology
Tietokannassa oleva lehden nimi: Measurement Science and Technology
Vuosikerta: 15
Numero: 10
Aloitussivu: 2001
Lopetussivu: 2004
Sivujen määrä: 4
ISSN: 0957-0233
DOI: https://doi.org/10.1088/0957-0233/15/10/009
Verkko-osoite: http://api.elsevier.com/content/abstract/scopus_id:5644289636
Tiivistelmä
Pulsed microchip lasers have become useful in a broad area of applications due to their robustness and low cost. The pulse widths of these lasers are typically from tens of picoseconds to a few nanoseconds, a range that has proved to be either difficult or costly to characterize by currently available instrumentation. As a cost-effective and sufficient solution for microchip laser characterization an autocorrelator was built. This long-arm (400 mm) intensity autocorrelator was designed to be easy to align and tolerant to non-idealities of the mechanical scanning process. Standard measurements were fully automated. © 2004 IOP Publishing Ltd.
Pulsed microchip lasers have become useful in a broad area of applications due to their robustness and low cost. The pulse widths of these lasers are typically from tens of picoseconds to a few nanoseconds, a range that has proved to be either difficult or costly to characterize by currently available instrumentation. As a cost-effective and sufficient solution for microchip laser characterization an autocorrelator was built. This long-arm (400 mm) intensity autocorrelator was designed to be easy to align and tolerant to non-idealities of the mechanical scanning process. Standard measurements were fully automated. © 2004 IOP Publishing Ltd.
Turun yliopiston Tutkimustietojärjestelmän portaali