A long-arm autocorrelator for measurement of pico- to nanosecond laser pulse widths



: Stenholm T., Soini J., Hänninen P.

: 2004

 Measurement Science and Technology

: Measurement Science and Technology

: 15

: 10

: 2001

: 2004

: 4

: 0957-0233

DOI: https://doi.org/10.1088/0957-0233/15/10/009

: http://api.elsevier.com/content/abstract/scopus_id:5644289636


Pulsed microchip lasers have become useful in a broad area of applications due to their robustness and low cost. The pulse widths of these lasers are typically from tens of picoseconds to a few nanoseconds, a range that has proved to be either difficult or costly to characterize by currently available instrumentation. As a cost-effective and sufficient solution for microchip laser characterization an autocorrelator was built. This long-arm (400 mm) intensity autocorrelator was designed to be easy to align and tolerant to non-idealities of the mechanical scanning process. Standard measurements were fully automated. © 2004 IOP Publishing Ltd.



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