A4 Refereed article in a conference publication

A Self-Test and Self-Repair Approach for Analog Integrated Circuits

Authors: Karmani Mouna, Khedhiri Chiraz, Hamdi Belgacem, Rahmani Amir-Mohammad, Man Ka Lok

Editors: Algimantas Kajackas, Yevgeni Koucheryavy

Publisher: IEEE

Publication year: 2012

First page : 117

Last page: 12