Simple trapped-ion architecture for high-fidelity Toffoli gates

: Massimo Borrelli, Laura Mazzola, Mauro Paternostro, Sabrina Maniscalco

Publisher: AMER PHYSICAL SOC

: 2011

 Physical Review A

: 12314

: 1

: 84

: 1

: 6

: 1050-2947

DOI: https://doi.org/10.1103/PhysRevA.84.012314

: http://link.aps.org/doi/10.1103/PhysRevA.84.012314