Can Dark Silicon Be Exploited to Prolong System Lifetime?

: Haghbayan MH, Rahmani AM, Liljeberg P, Jantsch A, Miele A, Bolchini C, Tenhunen H

Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

: 2017

: IEEE Design and Test

: IEEE DESIGN & TEST

: IEEE DES TEST

: 34

: 2

: 51

: 59

: 9

: 2168-2356