A1 Refereed original research article in a scientific journal

Can Dark Silicon Be Exploited to Prolong System Lifetime?

Authors: Haghbayan MH, Rahmani AM, Liljeberg P, Jantsch A, Miele A, Bolchini C, Tenhunen H

Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Publication year: 2017

Journal: IEEE Design and Test

Journal name in source: IEEE DESIGN & TEST

Journal acronym: IEEE DES TEST

Volume: 34

Issue: 2

First page : 51

Last page: 59

Number of pages: 9

ISSN: 2168-2356

DOI: https://doi.org/10.1109/MDAT.2016.2630317