A1 Refereed original research article in a scientific journal

Can Dark Silicon Be Exploited to Prolong System Lifetime?




AuthorsHaghbayan MH, Rahmani AM, Liljeberg P, Jantsch A, Miele A, Bolchini C, Tenhunen H

PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Publication year2017

JournalIEEE Design and Test

Journal name in sourceIEEE DESIGN & TEST

Journal acronymIEEE DES TEST

Volume34

Issue2

First page 51

Last page59

Number of pages9

ISSN2168-2356

DOIhttps://doi.org/10.1109/MDAT.2016.2630317




Last updated on 2024-26-11 at 23:21