A1 Journal article – refereed

Can Dark Silicon Be Exploited to Prolong System Lifetime?




List of Authors: Haghbayan MH, Rahmani AM, Liljeberg P, Jantsch A, Miele A, Bolchini C, Tenhunen H

Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Publication year: 2017

Journal: IEEE Design and Test

Journal name in source: IEEE DESIGN & TEST

Journal acronym: IEEE DES TEST

Volume number: 34

Issue number: 2

Number of pages: 9

ISSN: 2168-2356

DOI: http://dx.doi.org/10.1109/MDAT.2016.2630317



Last updated on 2021-24-06 at 08:40