A1 Refereed original research article in a scientific journal
Can Dark Silicon Be Exploited to Prolong System Lifetime?
Authors: Haghbayan MH, Rahmani AM, Liljeberg P, Jantsch A, Miele A, Bolchini C, Tenhunen H
Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Publication year: 2017
Journal: IEEE Design and Test
Journal name in source: IEEE DESIGN & TEST
Journal acronym: IEEE DES TEST
Volume: 34
Issue: 2
First page : 51
Last page: 59
Number of pages: 9
ISSN: 2168-2356
DOI: https://doi.org/10.1109/MDAT.2016.2630317