Photoelectron spectroscopy study of irradiation damage and metal-sulfur bonds of thiol on silver and copper surfaces




Laiho T, Leiro JA, Heinonen MH, Mattila SS, Lukkari J

PublisherELSEVIER SCIENCE BV

2005

Journal of Electron Spectroscopy and Related Phenomena

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

J ELECTRON SPECTROSC

142

2

105

112

8

0368-2048

DOIhttps://doi.org/10.1016/j.elspec.2004.10.001



Self-assembled l-dodecanethiol monolayers (SAMs) on silver and copper surfaces have been characterized with X-ray photoelectron spectroscopy (XPS) using both the synchrotron radiation and conventional Mg Kalpha excitation. Irradiation-induced changes in thiolate SAMs on Cu and Ag were observed. The identification of the sulfur species has been done. Results obtained confirm earlier studies of n-alkanethiols on silver. On copper (C12S/Cu), the observed S 2p spectrum is quite broad but the use of different excitation energies enabled us to identify four sulfur species on the surface. A S 2P(3/2) component of copper thiolate is observed at 162.6 eV. Three more doublets (161.9 eV, 163.2 eV and 163.8 eV) have been observed to develop during irradiation and they are assigned to chemisorbed sulfur on copper, to different dialkylsulfides and to sulfur-sulfur bonding, (C) 2004 Elsevier B.V. All rights reserved.

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