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Photoelectron spectroscopy study of irradiation damage and metal-sulfur bonds of thiol on silver and copper surfaces




TekijätLaiho T, Leiro JA, Heinonen MH, Mattila SS, Lukkari J

KustantajaELSEVIER SCIENCE BV

Julkaisuvuosi2005

JournalJournal of Electron Spectroscopy and Related Phenomena

Tietokannassa oleva lehden nimiJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

Lehden akronyymiJ ELECTRON SPECTROSC

Vuosikerta142

Numero2

Aloitussivu105

Lopetussivu112

Sivujen määrä8

ISSN0368-2048

DOIhttps://doi.org/10.1016/j.elspec.2004.10.001


Tiivistelmä
Self-assembled l-dodecanethiol monolayers (SAMs) on silver and copper surfaces have been characterized with X-ray photoelectron spectroscopy (XPS) using both the synchrotron radiation and conventional Mg Kalpha excitation. Irradiation-induced changes in thiolate SAMs on Cu and Ag were observed. The identification of the sulfur species has been done. Results obtained confirm earlier studies of n-alkanethiols on silver. On copper (C12S/Cu), the observed S 2p spectrum is quite broad but the use of different excitation energies enabled us to identify four sulfur species on the surface. A S 2P(3/2) component of copper thiolate is observed at 162.6 eV. Three more doublets (161.9 eV, 163.2 eV and 163.8 eV) have been observed to develop during irradiation and they are assigned to chemisorbed sulfur on copper, to different dialkylsulfides and to sulfur-sulfur bonding, (C) 2004 Elsevier B.V. All rights reserved.

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