A4 Vertaisarvioitu artikkeli konferenssijulkaisussa
The Imaging X-ray Polarimetry Explorer (IXPE) at last!
Tekijät: Soffitta P., Baldini L., Baumgartner W., Bellazzini R., Bongiorno S.D., Bucciantini N., Costa E., Dovčiak M., Ehlert S., Kaaret P.E., Kolodziejczak J.J., Latronico L., Marin F., Marscher A.P., Marshall H.L., Matt G., Muleri F., O’Dell S.L., Poutanen J., Ramsey B., Romani R.W., Slane P., Tennant A.F., Turolla R., Weisskopf M.C., Agudo I., Antonelli L.A., Bachetti M., Bianchi S., Bonino R., Brez A., Capitanio F., Castellano S., Cavazzuti E., Chen C.T., Ciprini S., De Rosa A., Del Monte E., Di Gesu L., Di Lalla N., Di Marco A., Donnarumma I., Doroshenko V., Enoto T., Evangelista Y., Fabiani S., Ferrazzoli R., Garcia J.A., Gunji S., Hayashida K., Heyl J., Iwakiri W., Jorstad S.G., Karas V., Kislat F., Kitaguchi T., Krawczynski H., La Monaca F., Liodakis I., Maldera S., Manfreda A., Marinucci A., Massaro F., Mitsuishi I., Mizuno T., Negro M., Ng C.Y., Omodei N., Oppedisano C., Papitto A., Pavlov G.G., Peirson A.L., Perri M., Pesce-Rollins M., Petrucci P.O., Pilia M., Possenti A., Puccetti S., Rankin J., Ratheesh A., Roberts O.J., Sgrò C., Spandre G., Swartz D.A., Tamagawa T., Tavecchio F., Taverna R., Tawara Y., Thomas N.E., Tombesi F., Trois A., Tsygankov S.S., Vink J., Wu K., Xie F., Zane S.
Toimittaja: Oswald H. Siegmund, Keri Hoadley
Konferenssin vakiintunut nimi: SPIE Optical Engineering + Applications
Kustantaja: SPIE
Kustannuspaikka: San Diego
Julkaisuvuosi: 2023
Journal: Proceedings of SPIE : the International Society for Optical Engineering
Kokoomateoksen nimi: Proceedings of SPIE: UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXIII
Tietokannassa oleva lehden nimi: Proceedings of SPIE - The International Society for Optical Engineering
Sarjan nimi: Proceedings of SPIE : the International Society for Optical Engineering
Vuosikerta: 12678
Aloitussivu: 1267803
ISBN: 978-1-5106-6570-5
eISBN: 978-1-5106-6571-2
ISSN: 0277-786X
eISSN: 1996-756X
DOI: https://doi.org/10.1117/12.2677296
Verkko-osoite: https://doi.org/10.1117/12.2677296
IXPE, the first observatory dedicated to imaging x-ray polarimetry, was launched on Dec 9, 2021 and is operating successfully. A partnership between NASA and the Italian Space Agencey (ASI) IXPE features three x-ray telescopes each comprised of a mirror module assembly with a polarization sensitive detector at its focus. An extending boom was deployed on orbit to provide the necessary 4 m focal length. A three-axis-stabilized spacecraft provides power, attitude determination and control, and commanding. After one year of observation IXPE has measured statistically significant polarization from almost all the classes of celestial sources that emit X-rays. In the following we describe the IXPE mission, reporting on its performance after 1.5 year of operations. We show the main astrophysical results which are outstanding for a SMEX mission.
