Defining optimal thickness for maximal self-field J(c) in YBCO/CeO2 multilayers grown on buffered metal

: Tuomola Aino, Rivasto Elmeri, Aye Moe M, Zhao Yue, Huhtinen Hannu, Paturi Petriina

Publisher: IOP Publishing Ltd

: 2023

: Journal of Physics: Condensed Matter

: JOURNAL OF PHYSICS-CONDENSED MATTER

: J PHYS-CONDENS MAT

: 475001

: 35

: 47

: 9

: 0953-8984

DOI: https://doi.org/10.1088/1361-648X/acee3d(external)

: https://iopscience.iop.org/article/10.1088/1361-648X/acee3d(external)

The effect of multilayering YBa2Cu3O6+x (YBCO) thin films with sequentially deposited CeO2 layers between YBCO layers grown on buffered metallic template is investigated to optimize the self-field critical current density J(c)(0) . We have obtained that the improvement in J(c)(0) clearly depends on the YBCO layer thickness and temperature, where at high temperature J(c)(0) can be increased even 50% when compared with the single layer YBCO films. Based on our experimental results and theoretical approach to the growth mechanism during multilayer deposition, we have defined a critical thickness for the YBCO layer, where the maximal self-field J(c)(0) is strongly related to the competing issues between the uniform and nonuniform strain relaxation and the formation of dislocations and other defects during the film growth. Our results can be directly utilized in the future coated conductor technology, when maximizing the overall in-field J(c)(B) by combining both the optimal crystalline quality and flux pinning properties typically in bilayer film structures.