Refereed article in conference proceedings (A4)

Thread-level Parallelism in Fault Simulation of Deep Neural Networks on Multi-Processor Systems




List of Authors: Karami Masoomeh, Haghbayan Mohammad-Hashem, Ebrahimi Masoumeh, Miele Antonio, Plosila Juha

Conference name: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Publication year: 2022

Journal: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Book title *: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Title of series: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

ISBN: 978-1-6654-5939-6

eISBN: 978-1-6654-5938-9

ISSN: 2576-1501

eISSN: 2765-933X

DOI: http://dx.doi.org/10.1109/DFT56152.2022.9962358

URL: https://ieeexplore.ieee.org/document/9962358



Last updated on 2022-05-12 at 10:00