A1 Vertaisarvioitu alkuperäisartikkeli tieteellisessä lehdessä
The dependence of resistively measured Bc2 and Birr on BaZrO3 concentration in YBa2Cu3O 6+x thin films
Tekijät: Malmivirta M., Palonen H., Huhtinen H., Paturi P.
Kustantaja: Institute of Physics Publishing
Julkaisuvuosi: 2014
Journal: Journal of Physics: Conference Series
Tietokannassa oleva lehden nimi: Journal of Physics: Conference Series
Vuosikerta: 507
Sivujen määrä: 4
ISSN: 1742-6596
DOI: https://doi.org/10.1088/1742-6596/507/1/012030
Verkko-osoite: http://api.elsevier.com/content/abstract/scopus_id:84902267151
Tiivistelmä
The effect of BaZrO (BZO) concentration on B and B2 in YBaCuO+x (YBCO) thin films was investigated with resistive measurements. It was found that in field out-of-plane configuration both B and B2 decrease with the highest BZO concentration of 9 wt% whereas the other samples show no significant change. The angular dependence of B of the highest BZO concentration sample has a pronounced c-axis peak that is typical for BZO-doped YBCO but the others do not exhibit that clear peak. On the other hand, B 2 obeys the Blatter scaling law and the Blatter scaling parameter γ levels off to 3 - 3.5 above few wt% of BZO. © Published under licence by IOP Publishing Ltd.
The effect of BaZrO (BZO) concentration on B and B2 in YBaCuO+x (YBCO) thin films was investigated with resistive measurements. It was found that in field out-of-plane configuration both B and B2 decrease with the highest BZO concentration of 9 wt% whereas the other samples show no significant change. The angular dependence of B of the highest BZO concentration sample has a pronounced c-axis peak that is typical for BZO-doped YBCO but the others do not exhibit that clear peak. On the other hand, B 2 obeys the Blatter scaling law and the Blatter scaling parameter γ levels off to 3 - 3.5 above few wt% of BZO. © Published under licence by IOP Publishing Ltd.
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