A1 Refereed original research article in a scientific journal

Thickness dependence of microcrack formation in YBa2Cu3O6+x thin films on NdGaO3 (001) substrates




AuthorsPalonen H, Huhtinen H, Paturi P

PublisherELSEVIER SCIENCE SA

Publication year2011

JournalThin Solid Films

Journal name in sourceTHIN SOLID FILMS

Journal acronymTHIN SOLID FILMS

Number in series22

Volume519

Issue22

First page 8058

Last page8062

Number of pages5

ISSN0040-6090

DOIhttps://doi.org/10.1016/j.tsf.2011.06.106(external)


Abstract
Thickness dependence of parallel microcrack formation in YBa2Cu3O6+x thin films prepared by pulsed laser deposition from nano- (n) and microcrystalline (mu) targets on NdGaO3 (001) is systematically investigated. Atomic force microscope and x-ray diffraction measurements show parallel microcracks normal to uniaxial twin boundaries. The amount of microcracks increases with film thickness. Superconducting properties of the films decrease very strongly with film thickness as a result of microcrack formation. The n-films have more rigid lattice and thus show more extensive cracking than mu-films. It is found that the mu-films have a thickness threshold (similar to 70 nm) where the first signs of cracking appear. (C) 2011 Elsevier BM. All rights reserved.


Research Areas



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