Juha-Pekka Lehtiö
- Decreasing Interface Defect Densities via Silicon Oxide Passivation at Temperatures Below 450 degrees C (2020)
- ACS Applied Materials and Interfaces
- Dimer-vacancy defects on Si(1 0 0): The role of nickel impurity (2020)
- Applied Surface Science
- Observation of Crystalline Oxidized Silicon Phase (2019)
- Advanced Materials Interfaces
- Crystalline and oxide phases revealed and formed on InSb(111)B (2018)
- Scientific Reports
- Imaging empty states on the Ge(100) surface at 12 K (2018)
- Physical Review B
- Oxidation-Induced Changes in the ALD-Al2O3/InAs(100) Interface and Control of the Changes for Device Processing (2018)
- ACS Applied Materials and Interfaces
- SILICON-ON-INSULATOR WITH CRYSTALLINE SILICON OXIDE (2018) Laukkanen P., Kuzmin M., Mäkelä J., Tuominen M., Punkkinen M., Lahti A., Kokko K., Lehtiö J.-P.
- Surface doping of GaxIn1−xAs semiconductor crystals with magnesium (2018)
- Materialia
- Surface topography and electrical properties in Sr2FeMoO6 films studied at cryogenic temperatures (2018)
- Journal of Physics: Conference Series
- Decreasing Defect-State Density of Al2O3/GaxIn1- xAs Device Interfaces with InOx Structures (2017)
- Advanced Materials Interfaces