Refereed journal article or data article (A1)

Testing incompatibility of quantum devices with few states

List of Authors: Heinosaari Teiko, Miyadera Takayuki, Takakura Ryo


Publication year: 2021

Journal: Physical Review A

Journal name in source: PHYSICAL REVIEW A

Journal acronym: PHYS REV A

Volume number: 104

Issue number: 3

Number of pages: 18

ISSN: 2469-9926


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When observations must come from incompatible devices and cannot be produced by compatible devices is a property that motivates two integer-valued quantifications of incompatibility, called incompatibility dimension and compatibility dimension. The first one quantifies how many states are minimally needed to detect incompatibility if the test states are chosen carefully, whereas the second one quantifies how many states one may have to use if they are randomly chosen. With concrete examples we show that these quantities have unexpected behavior with respect to noise.

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Last updated on 2021-28-10 at 14:38