Refereed journal article or data article (A1)
Testing incompatibility of quantum devices with few states
List of Authors: Heinosaari Teiko, Miyadera Takayuki, Takakura Ryo
Publisher: AMER PHYSICAL SOC
Publication year: 2021
Journal: Physical Review A
Journal name in source: PHYSICAL REVIEW A
Journal acronym: PHYS REV A
Volume number: 104
Issue number: 3
Number of pages: 18
ISSN: 2469-9926
DOI: http://dx.doi.org/10.1103/PhysRevA.104.032228
Self-archived copy’s web address: https://arxiv.org/abs/2105.08320
Abstract
When observations must come from incompatible devices and cannot be produced by compatible devices is a property that motivates two integer-valued quantifications of incompatibility, called incompatibility dimension and compatibility dimension. The first one quantifies how many states are minimally needed to detect incompatibility if the test states are chosen carefully, whereas the second one quantifies how many states one may have to use if they are randomly chosen. With concrete examples we show that these quantities have unexpected behavior with respect to noise.
When observations must come from incompatible devices and cannot be produced by compatible devices is a property that motivates two integer-valued quantifications of incompatibility, called incompatibility dimension and compatibility dimension. The first one quantifies how many states are minimally needed to detect incompatibility if the test states are chosen carefully, whereas the second one quantifies how many states one may have to use if they are randomly chosen. With concrete examples we show that these quantities have unexpected behavior with respect to noise.
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