A1 Vertaisarvioitu alkuperäisartikkeli tieteellisessä lehdessä
Evidence for the Eu 4f Character of Conduction-Band Edge at the Eu2O3 Surface Studied by Scanning Tunneling Spectroscopy
Tekijät: Lehtiö Juha Pekka, Hadamek Tobias, Kuzmin Mikhail, Laukkanen Pekka, Demkov Alexander A
Kustantaja: Elsevier BV
Julkaisuvuosi: 2021
Journal: Surface Science
Artikkelin numero: 121763
Vuosikerta: 705
eISSN: 1879-2758
DOI: https://doi.org/10.1016/j.susc.2020.121763
Rinnakkaistallenteen osoite: https://research.utu.fi/converis/portal/detail/Publication/51029083
Effects of localized Eu 4f levels on the band gap properties of Eu2O3 have attracted significant fundamental and technological interest, and the band structure of such thin films has been thoroughly studied by photoelectron spectroscopies (T. Hadamek et al., J. Appl. Phys. 127 (2020) 074101). Here we apply a scanning tunneling spectroscopy (STS) to clarify the character of the conduction band (CB) bottom at the surface of epitaxial Eu2O3 grown on GaN(0001)/Si(111) substrates. It is shown that the CB edge is formed solely by an unoccupied Eu 4f state 0.8 eV above the Fermi level at the Eu2O3 surface and does not overlap with unoccupied Eu 5d6s states laying more than 2 eV higher than the bottom of the 4f band
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