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Growth Condition Dependence of Microcracks in YBCO Thin Films Pulsed Laser Deposited on NdGaO3 (001) Substrates




TekijätPalonen H, Huhtinen H, Paturi P

KustantajaIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Julkaisuvuosi2015

JournalIEEE Transactions on Applied Superconductivity

Tietokannassa oleva lehden nimiIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY

Lehden akronyymiIEEE T APPL SUPERCON

Artikkelin numeroARTN 6600604

Vuosikerta25

Numero3

Sivujen määrä4

ISSN1051-8223

eISSN1558-2515

DOIhttps://doi.org/10.1109/TASC.2014.2365407


Tiivistelmä
The high-temperature superconductor YBCO is typically used as a thin film or coating in applications, but the brittle YBCO layer is often prone to develop small cracks, which reduce its performance. To better understand the crack formation and its connection to the uniaxial twinning state of YBCO on NdGaO3 (001) substrates, a series of YBCO thin films has been grown by pulsed laser deposition with varying deposition temperature and growth rate. The structural properties of the samples are analyzed by atomic force microscopy and X-ray diffraction. The crack formation reduces the critical current densities, which have been measured magnetically. The results show a significant decrease in crack formation with decreased deposition temperature and also with decreased growth rate.



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