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Probabilistic Analysis of Probe Reliability in Differential Gene Expression Studies with Short Oligonucleotide Arrays




TekijätLahti L, Elo LL, Aittokallio T, Kaski S

KustantajaIEEE COMPUTER SOC

Julkaisuvuosi2011

JournalIEEE/ACM Transactions on Computational Biology and Bioinformatics

Tietokannassa oleva lehden nimiIEEE-ACM TRANSACTIONS ON COMPUTATIONAL BIOLOGY AND BIOINFORMATICS

Lehden akronyymiIEEE ACM T COMPUT BI

Numero sarjassa1

Vuosikerta8

Numero1

Aloitussivu217

Lopetussivu225

Sivujen määrä9

ISSN1545-5963

DOIhttps://doi.org/10.1109/TCBB.2009.38


Tiivistelmä
Probe defects are a major source of noise in gene expression studies. While existing approaches detect noisy probes based on external information such as genomic alignments, we introduce and validate a targeted probabilistic method for analyzing probe reliability directly from expression data and independently of the noise source. This provides insights into the various sources of probe-level noise and gives tools to guide probe design.



Last updated on 2024-26-11 at 22:24