ToF-SIMS study of 1-dodecanethiol adsorption on Au, Ag, Cu and Pt surfaces
: Laiho T, Leiro JA
Publisher: JOHN WILEY & SONS LTD
: 2008
Surface and Interface Analysis
: SURFACE AND INTERFACE ANALYSIS
: SURF INTERFACE ANAL
: 40
: 1
: 51
: 59
: 9
: 0142-2421
DOI: https://doi.org/10.1002/sia.2722
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been used to perform a chemical analysis of long-chain thiol (CH3(CH2)(11)SH)-treated gold, silver, copper and platinum surfaces. All the mass peaks from positive and negative ion spectra within the range m/z = 0-2000 u are studied. ToF-SIMS data revealed that on gold, silver and copper substrates 1-dodecanethiol form dense standing-up phases, but on platinum being a catalytically active substrate, we were able to identify also surface-aligned parallel lying molecules in addition to a standing thiolate layer. Our study shows that when ToF-SIMS spectra are analyzed, not only the existence of oligomers but also metal + hydrocarbon fragments give information about the order of SAM. Copyright (c) 2008 John Wiley & Sons, Ltd.
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