A1 Vertaisarvioitu alkuperäisartikkeli tieteellisessä lehdessä

Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM




TekijätBieletzki M, Hynninen T, Soini TM, Pivetta M, Henry CR, Foster AS, Esch F, Barth C, Heiz U

KustantajaROYAL SOC CHEMISTRY

Julkaisuvuosi2010

JournalPhysical Chemistry Chemical Physics

Tietokannassa oleva lehden nimiPHYSICAL CHEMISTRY CHEMICAL PHYSICS

Lehden akronyymiPHYS CHEM CHEM PHYS

Vuosikerta12

Numero13

Aloitussivu3203

Lopetussivu3209

Sivujen määrä7

ISSN1463-9076

DOIhttps://doi.org/10.1039/b923296f


Tiivistelmä
The surface topography and local surface work function of ultrathin MgO(001) films on Ag(001) have been studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM). First principles calculations have been used to explain the contrast formation of nc-AFM images. In agreement with literature, thin MgO films grow in islands with a quasi rectangular shape. Contrary to alkali halide films supported on metal surfaces, where the island heights can be correctly measured, small MgO islands are either imaged as depressions or elevations depending on the electrostatic potential of the tip apex. Correct island heights therefore cannot be given without knowing the precise contrast formation discussed in this paper. KPFM shows a silver work function which is reduced by the MgO islands. The values for the work function differences for one and two layer thin films are -1.1 and -1.4 eV, respectively, in good agreement with recent calculations and experiments.



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