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Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions
Tekijät: Kawai S, Canova FF, Glatzel T, Hynninen T, Meyer E, Foster AS
Kustantaja: AMER PHYSICAL SOC
Julkaisuvuosi: 2012
Journal: Physical Review Letters
Tietokannassa oleva lehden nimi: PHYSICAL REVIEW LETTERS
Lehden akronyymi: PHYS REV LETT
Artikkelin numero: ARTN 146101
Vuosikerta: 109
Numero: 14
Sivujen määrä: 5
ISSN: 0031-9007
DOI: https://doi.org/10.1103/PhysRevLett.109.146101
Tiivistelmä
We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection.
We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection.
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